BDEM-20 Desktop Tungsten Filament Scanning Electron Microscope
Introduction
The BDEM-20 benchtop SEM utilizes a wider range of accelerating voltages, 1KV steps, and a maximum magnification of 360,000x with a resolution of up to 5nm. The tabletop deceleration mode allows real-time observation of low-conductivity products without the need for gold spraying. The extra-large sample compartment can be integrated with a wide range of in-situ expansion platforms to meet different experimental and inspection needs.
Details
Overview
Packaging & Delivery
Packaging Details:Strong Carton with Polyfoam Protection
Port:Beijing
Lead Time:Within 2-4 Weeks after Receiving Payment
Introduction
Introduction
The BDEM-20 benchtop SEM utilizes a wider range of accelerating voltages, 1KV steps, and a maximum magnification of 360,000x with a resolution of up to 5nm. The tabletop deceleration mode allows real-time observation of low-conductivity products without the need for gold spraying. The extra-large sample compartment can be integrated with a wide range of in-situ expansion platforms to meet different experimental and inspection needs.
Features
1.Sample stage
Optional 5-axis center sample stage.
2.Large sample compartment
Extra large sample compartment, 185mm (L)*176mm (W)*125mm (H)
3.Low vacuum mode for option
1-60Pa low vacuum mode option.
4.High voltage reduction for option
10kV sample table high voltage reduction option.
5.Camera in the sample compartment
Addition of a camera inside the sample compartment for real-time observation of the sample compartment.
6.Software
Software upgrades automatic brightness contrast auto-focus, auto-dispersion, large picture stitching and other functional modules.
7.Tungsten filamentElectron Gun
The gun head always maintains 5*10-5Pa vacuum, which greatly improves the service life of tungsten filament, and LaB6 filament is optional.
8.Sample change time
Sample change time 30s.
9.Abundant in-situ expansioninterface
Abundant in-situ expansion interface with stretching table, heating table, TEC cold table, nanoindentation and other in-situ products.
Specification
|
Item |
Specification |
|
Environmental Requirements |
AC 220V, 50Hz, 1kW. No shock absorber required |
|
Acceleration Voltage |
3kV~18kV continuously adjustable, 1kV step |
|
Electron Gun |
Pre-centered tungsten filament, integrated condenser lens, no need to manually adjust the objective diaphragm |
|
Magnification |
25-360,000X |
|
Detector |
Four-division backscattered electron detector |
|
|
Secondary electron detector |
|
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Integrated spectrometer (optional) |
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Stroke of Sample Stage |
Triaxial: X:60mm, Y: 60mm, T: ±45° Axis: X: 90mm, Y:50mm, Z: 25mm, R: 360°, T:-10°~90° (optional) |
|
Maximum Sample Size |
Ф50mm*35mm (H) |
|
Working Distance |
5-35mm |
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Vacuum Mode |
High vacuum mode: sample change time 30s. Low vacuum mode (optional): 1-60Pa automatic control |
|
Imaging Mode |
Video Mode: 512*512 pixels without small window scanning. Fast Scan Mode: 512*512 pixels. Slow Scan Mode: 2048*2048 pixels. Image Format: BMP, TIFF, JPEG, PNG |
|
Navigation Function |
Optical camera navigation with in-cabin camera for real-time observation of the sample compartment |
|
Automatic Function |
One-touch auto-configuration of brightness, contrast, auto-focus, etc. |
|
Sizes |
Main unit: 650mm (L)*553mm (W)*505mm (H) Mechanical pump: 454mm*165mm*252mm |
|
Extra large sample compartment |
Length 185mm, Width 176mm, Height 125mm |
Note: ● Standard Outfit, ○ Optional
Sample Images
Industrial inspection
Functional inorganic materials
Fiber testing
Chemical testing
Plant testing
Life sciences
Ternary lithium battery
Drug testin
Chemical material
Metal material
Resistance detection
Aluminum oxide film testing
