BS-4020B Trinocular Industrial Wafer Inspection Microscope
Introduction
BS-4020B industrial inspection microscope has been specially designed for inspections of various size wafers and large PCB. This microscope can provide a reliable, comfortable and precise observation experience. With perfectly performed structure, high-definition optical system and ergonomical operating system, BS-4020B realizes professional analysis and meets various needs of research and inspection of wafers, FPD, circuit package, PCB, material science, precision casting, metalloceramics, precision mould, semiconductor and electronics etc.
Details
Overview
Packaging & Delivery
Packaging Details:Strong Carton with Polyfoam Protection
Port:Beijing
Lead Time:Within 4-5 Weeks after Receiving Payment
Introduction
BS-4020B industrial inspection microscope has been specially designed for inspections of various size wafers and large PCB. This microscope can provide a reliable, comfortable and precise observation experience. With perfectly performed structure, high-definition optical system and ergonomical operating system, BS-4020A realizes professional analysis and meets various needs of research and inspection of wafers, FPD, circuit package, PCB, material science, precision casting, metalloceramics, precision mould, semiconductor and electronics etc.
Features
1.Perfect microscopic illumination system.
2.High quality Semi-APO and APO Bright field &Dark field objectives.
3.The operating panel is in the front of the microscope, convenient to operate.
4.Ergo tilting trinocular viewing head.
5.Focusing mechanism and fine adjustment handle of stage with low hand position.
6.The stage has a built-in clutching handle.
7. Oversized stage (14”x 12”) can be used for large wafers and PCB.
8. 12” wafers holder comes with the microscope.
9. Anti-static protective cover can reduce dust.
10. Longer working distance and high NA objective.
11. Various observation methods can meet diverse testing requirements.
Bright field of reflected illumination
Dark field
Bright field of transmitted illumination
Simple polarization
Reflected illumination DIC
Application
BS-4020B industrial inspection microscope is an ideal instrument for inspections of various size wafers and large PCB. This microscope can be used in universities, electronics and chips factories for research and inspection of wafers, FPD, circuit package, PCB, material science, precision casting, metalloceramics, precision mould, semiconductor and electronics etc.
Specification
|
Item |
Specification |
BS-4020A |
BS-4020B |
|
|
Optical System |
NIS45 Infinite Color Corrected Optical System (Tube length: 200mm) |
● |
● |
|
|
Viewing Head |
Ergo Tilting Trinocular Head, adjustable 0-35° inclined, interpupillary distance 47mm-78mm; splitting ratio Eyepiece:Trinocular=100:0 or 20:80 or 0:100 |
● |
● |
|
|
Seidentopf Trinocular Head, 30° inclined, interpupillary distance: 47mm-78mm; splitting ratio Eyepiece:Trinocular=100:0 or 20:80 or 0:100 |
○ |
○ |
||
|
Seidentopf Binocular Head, 30° inclined, interpupillary distance: 47mm-78mm |
○ |
○ |
||
|
Eyepiece |
Super wide field plan eyepiece SW10X/25mm, diopter adjustable |
● |
● |
|
|
Super wide field plan eyepiece SW10X/22mm, diopter adjustable |
○ |
○ |
||
|
Extra wide field plan eyepiece EW12.5X/17.5mm, diopter adjustable |
○ |
○ |
||
|
Wide field plan eyepiece WF15X/16mm, diopter adjustable |
○ |
○ |
||
|
Wide field plan eyepiece WF20X/12mm, diopter adjustable |
○ |
○ |
||
|
Objective |
NIS45 Infinite LWD Plan Semi-APO Objective (BF & DF), M26 |
5X/NA=0.15, WD=20mm |
● |
● |
|
10X/NA=0.3, WD=11mm |
● |
● |
||
|
20X/NA=0.45, WD=3.0mm |
● |
● |
||
|
NIS45 Infinite LWD Plan APO Objective (BF & DF), M26 |
50X/NA=0.8, WD=1.0mm |
● |
● |
|
|
100X/NA=0.9, WD=1.0mm |
● |
● |
||
|
NIS60 Infinite LWD Plan Semi-APO Objective (BF), M25 |
5X/NA=0.15, WD=20mm |
○ |
○ |
|
|
10X/NA=0.3, WD=11mm |
○ |
○ |
||
|
20X/NA=0.45, WD=3.0mm |
○ |
○ |
||
|
NIS60 Infinite LWD Plan APO Objective (BF), M25 |
50X/NA=0.8, WD=1.0mm |
○ |
○ |
|
|
100X/NA=0.9, WD=1.0mm |
○ |
○ |
||
|
Nosepiece |
Backward Sextuple Nosepiece (with DIC slot) |
● |
● |
|
|
Condenser |
LWD condenser N.A.0.65 |
○ |
● |
|
|
Transmitted Illumination |
40W LED power supply with optical fiber light guide, intensity adjustable |
○ |
● |
|
|
Reflected Illumination |
Reflected light 24V/100W halogen lamp, Koehler illumination, with 6 position turret |
● |
● |
|
|
100W halogen lamp house |
● |
● |
||
|
Reflected light with 5W LED lamp, Koehler illumination, with 6 position turret |
○ |
○ |
||
|
BF1 bright field module |
● |
● |
||
|
BF2 bright field module |
● |
● |
||
|
DF dark field module |
● |
● |
||
|
Built-in ND6, ND25 filter and color correction filter |
○ |
○ |
||
|
ECO Function |
ECO function with ECO button |
● |
● |
|
|
Focusing |
Low-position coaxial coarse and fine focusing, fine division 1μm, Moving range 35mm |
● |
● |
|
|
Stage |
3 layers mechanical stage with clutching handle, size 14”x12” (356mmx305mm); moving range 356mmX305mm; Lighting area for transmitted light: 356x284mm. |
● |
● |
|
|
Wafer holder: could be used to hold 12” wafer |
● |
● |
||
|
DIC Kit |
DIC Kit for reflected illumination (can be used for 10X, 20X, 50X, 100X objectives) |
○ |
○ |
|
|
Polarizing Kit |
Polarizer for reflected illumination |
○ |
○ |
|
|
Analyzer for reflected illumination, 0-360° rotatable |
○ |
○ |
||
|
Polarizer for transmitted illumination |
○ |
○ |
||
|
Analyzer for transmitted illumination |
○ |
○ |
||
|
Other Accessories |
0.5X C-mount Adapter |
○ |
○ |
|
|
1X C-mount Adapter |
○ |
○ |
||
|
Dust Cover |
● |
● |
||
|
Power Cord |
● |
● |
||
|
Calibration slide 0.01mm |
○ |
○ |
||
|
Specimen Presser |
○ |
○ |
||
Note: ● Standard Outfit, ○ Optional
